Oxford Instruments has introduced a new tool for coating thickness measurement and materials analysis. This new model, the MAXXI 6, is based on X-ray fluorescence technology. It encompasses a high resolution silicon drift detector (SDD), measuring thinnest coatings down to the nanoscale and element composition at trace level to ensure high quality control for up to date industrial standards.

The MAXXI 6 is made in Taunusstein, Germany and approved by the PTB (Physikalisch Technische Bundesanstalt) for the highest level of radiation safety.

Scope of application

Coating thickness measurement based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis requiring little to no sample preparation.

The MAXXI 6 is capable of analysing solids or liquids over a wide element range from Al13 to U92. In combination with a high resolution SDD its aforementioned ability to measure thinnest coatings down to the nanoscale and element composition at trace level helps meet requirements for many industries e.g. in the plating industry and for printed circuit board production.

Eight exchangeable collimators enable complete application coverage and the SDD offers optimal efficiency at all energy levels with an energy resolution of up to 140 eV. With an unlimited selection of elements and layer structures for thickness and composition analysis, the MAXXI 6 ensures consistent high production quality in the sector of metal finishing, electronics, compliance testing, metal alloys and alternative energy.

Simplifying the analysis procedure

Coating thickness analysis with the MAXXI 6 can be done in only three steps:

1. Place the sample in the chamber

2. Select the sample point,

3. Press start.

The intuitive software is based on Windows 7.Several calibration features, including empirical calibration, FP model or preloaded calibration for RoHS and precious metals facilitate the analysis.

The hardware contributes to the convenient handling: A standard PC or notebook can be connected through USB to the MAXXI 6 without additional hardware or firmware. The large slotted sample chamber with an internal volume of 500mm x 450mm x 170mm is suitable for a wide variety of standard and oversized samples, the programmable stage allows automated measurement and maximises the table travel range and speed.

Olaf Neuhausen, Managing Director of Oxford Instruments Roentgenanalytik GmbH, said: “Our goal was to develop a high-end coating thickness analyser without compromising on the ease of use. The MAXXI 6 offers a combination of features which, to date, has not been available in the market."